| Citation: |
LIU Jiang, CUI Mu-han, GAO Song-tao, SUI Yong-xin, YANG Huai-jiang. FFT-ernike combined algorithm of wavefront reconstruction in easurement of optical surfaces based on projected fringes deflectometry[J]. Journal of Applied Optics, 2013, 34(4): 614-618.
|
|
［1］MARKUS C K, JURGEN K,GERD H. Phase measuring deflectometry: a new approach to measure specular free-orm surfaces[J]. SPIE，2004，5457：366-76.
[2]WANG Jian-eng ,LIU Ke .LI Yan-iu ,et al. Comparison of wavefront reconstruction with modal method and zonal[J]. SPIE ,2011,8197A:1-0. [3]RIMMER M P.ethod for evaluating lateral shearing interferograms [J] . Appl. Opt., 1974, 13(3):623-29. [4]CUBALCHINI R. Modal wavefront estimation from phase derivative measurements[J]. J.Opt.Soc.Am.,1979,69(1):972-77. [5]谢苏隆. Zernike多项式拟合曲面中拟合精度与采样点数目研究[J] .应用光学, 2010,31(6): 944-49. XIE Su-ong. Sampling point number in curved surface fitting with Zernike polynomials [J].Journal of Applied Optics, 2010, 31(6): 944-49. (in Chinese with an English abstract) [6]SOUTHWELL W H. Wave-ront estimation from wave-ront slope measurements[J]. J. Opt. Soc. Am.,1980, 70(8): 998-006. [7]KLAUS F, CHRIS L,KOLIOPOU L. Wavefront reconstruction from noisy slope or difference data using the discrete fourier transform[J]. SPIE ,1985, 551: 75-0. [8]MICHEL G . Method for surface reconstruction from slope or curvature measurements of rectangular areas[J].Applied Optics,1997, 36(20): 4823-829. [9]SU Peng ,ROBERT E,PARKS, et al. Software configurable optical test system: a computerized reverse Hartmann test[J]. Applied Optics ,2010, 49(23): 4404-412. [10]MALACARA D. Optical shop testing[M].3rd ed. Hoboken:John Wiley&Sons,Inc.,2007. [11]王灵杰, 张新, 张建萍, 等. 自由曲面空间光学系统设计研究[J]. 应用光学，2012，33(6): 1041-046. WANG Ling-ie, ZHANG Xin, ZHANG Jian-ing, et al. Free-orm surface space optical system[J]. Journal of Applied Optics, 2012，33(6): 1041-046. (in Chinese with an English abstract) |
| [1] | CHEN Yayi, CHEN Yunyun, ZHANG Jingyun, YANG Cuihong. Effect of phase object position on results of Moire deflectometry[J]. Journal of Applied Optics, 2022, 43(5): 943-949. DOI: 10.5768/JAO202243.0503003 |
| [2] | ZHAO Tingting, BAI Fuzhong, XU Yongxiang, GAO Xiaojuan. Simple correction method for projection fringe period based on parameter calibration[J]. Journal of Applied Optics, 2021, 42(1): 119-124. DOI: 10.5768/JAO202142.0103004 |
| [3] | LIU Lu, PAN Yanjuan, XI Dongdong, WANG Yuwei, TANG Qixing. Phase unwrapping errors correction for phase-encoding based on fringe projection profilometry[J]. Journal of Applied Optics, 2020, 41(5): 978-983. DOI: 10.5768/JAO202041.0502007 |
| [4] | SHI Yaoqun, DENG Linjia, WANG Zhaoxu, FU Yanjun, ZHONG Kejun, GUAN Bingliang. Micro-objects measurement system based on structured light fringe projection[J]. Journal of Applied Optics, 2019, 40(6): 1120-1125. DOI: 10.5768/JAO201940.0603007 |
| [5] | Qiu Lei, Qian Bin, Fu Yanjun, Zhong Kejun. Three-dimensional shape measurement method based on sinusoidal and triangular fringe projection[J]. Journal of Applied Optics, 2018, 39(4): 522-527. DOI: 10.5768/JAO201839.0403002 |
| [6] | Wang Liu, Chen Chao, Gao Nan, Zhang Zonghua. Three-dimensional shape measurement of high reflective objects based on adaptive fringe-pattern projection[J]. Journal of Applied Optics, 2018, 39(3): 373-378. DOI: 10.5768/JAO201839.0303001 |
| [7] | Zhang Yongtao, Wang Yize, Wang Yi, Song Zhiwei. Effect of electrooptic material modulation error on parallel beam interference projection[J]. Journal of Applied Optics, 2016, 37(2): 235-239. DOI: 10.5768/JAO201637.0203002 |
| [8] | AN Dong, DA Fei-peng, GAI Shao-yan, LU Ke. New system calibration method based on fringe projection profilometry[J]. Journal of Applied Optics, 2014, 35(1): 81-84. |
| [9] | WANG Lu-yang, DA Fei-peng. Rapid 3D shape measurement based on color-encoded fringe projection[J]. Journal of Applied Optics, 2011, 32(2): 276-281. |
| [10] | HUANG Yan-qun, TIAN Ai-ling. Obtain the Relative Displacement of the Fringe-centerlines in the 3-D Profilometry Measurement Using Grating Projection[J]. Journal of Applied Optics, 2004, 25(6): 57-60. |
WeChat
You are the 2912190th visitor, Welcome!
Address: No.9, west section of No.3 electronic road, Xi'an Post Code: 710065 Tel: 029-88288172
Copyright © Editorial Department of Journal of Applied Optics
陕公网安备 61011302001501号 
DownLoad: