[1]TIKHONOV A N, TIKHONRAVOV A V, TRUB-ETSKOV M K. Second order optimization methods in the synthesis of multilayer coatings[J]. Journal of Mathematical Physics, 1993,33(10):1339-1352.[2]TIKHONRAVOV A V,TRUBETSKOV M K,TIK-HONRAVOV A A, et al. Effects of interface roughness on the spectral properties of thin films and multilayer[J]. Applied Optics,2003,42(25):5140-5148.[3]王胭脂,张伟丽,范正修,等.SiO2薄膜折射率的准确拟合分析[J].中国激光,2008,35(5):760-763.WANG Yan-zhi, ZHANG Wei-li, FAN Zheng-xiu, et al. Analysis for accurately fitting the refractive index of SiO2 thin film[J]. Chinese Journal of Lasers, 2008,35(5):760-763. (in Chinese with an English abstract)[4]沈伟东,刘旭,叶辉,等.确定薄膜厚度和光学常数的一种新方法[J].光学学报,2004,24(7):885-889.SHEN Wei-dong, LIU Xu, YE Hui, et al. A new method for determination of the optical constants and thickness of thin film[J]. Acta Optica Sinica, 2004,24(7):885-889. (in Chinese with an English abstract)[5]顾培夫,陈海星,郑臻荣,等.弱吸收多层薄膜消光系数的反演[J].物理学报,2005,54(8):3722-3725.GU Pei-fu, CHEN Hai-xing, ZHENG Zhen-rong, et al. Determination of the extinction coefficient of a weakly absorbing multilayer system[J]. Acta Physica Sinica,2005,54(8):3722-3725. (in Chinese with an English abstract)[6]楚栋,宫兴致,程梁,等.基于遗传退火算法的多层薄膜厚度测量[J].光电工程,2010,37(2):45-49.CHU Dong, GONG Xing-zhi, CHENG Liang, et al. Multilayer film thickness measurement based on genetic simulated annealing algorithm[J]. Opto-Electronic Engineering, 2010,37(2):45-49. (in Chinese with an English abstract)[7]吴素勇.遗传算法在膜系设计中的应用[D].长沙:国防科技大学,2007:16-21.WU Su-yong. Design thin films by genetic algorithm[D]. Changsha: National University of Defence Technology, 2007:16-21. (in Chinese)[8]唐晋发,顾培夫,刘旭,等.现代光学薄膜技术[M].杭州:浙江大学出版社,2006.TANG Jin-fa, GU Peifu, LIU Xu, et al. Modern optical thin film technology[M]. Hangzhou: Zhejiang University Press, 2006. (in Chinese)[9]VERLY P G,TIKHONRAVOV A V,TRUBETSKOV M K.Efficient refinement algorithm for the synthesis of inhomogeneous optical coatings[J]. Applied Optics, 1997,36(7):1487-1495.[10]雷英杰,张善文,李续武,等.MATLAB遗传算法工具箱及应用[M].西安:西安电子科技大学出版社,2005.LEI Ying-jie, ZHANG Shan-wen, LI Xu-wu, et al. Introduce and apply the genetic algorithm search toolbox[M]. Xi’an: Xidian University Press, 2005. (in Chinese)[11]陈宝林.最优化理论与算法[M].北京:清华大学出版社,2005.CHEN Bao-lin. Optimization theory and algorithm[M]. Beijing: Tsinghua University Press, 2005. (in Chinese)[12]TIKHONRAVOV A V, TRUBETSKOV M K, KOKAREV M A, et al. Effects of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films[J]. Applied Optics,2002,41(13):2555-2560.[13]吴素勇,龙兴武,黄云,等.减小由光谱测量数据误差造成的薄膜光学参数反演不确定度的方法[J].中国激光, 2009,36(8):2171-2176.WU Su-yong,LONG Xing-wu,HUANG Yun,et al. Methods for decreasing optical parameters reverse determination uncertainty of thin films caused by spectral measurement errors[J]. Chinese Journal of Lasers, 2009,36(8):2171-2176. (in Chinese with an English abstract)
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