Citation: | WANG Hong-you, SI Xin-sheng. Three-dimensional body measurement based on optimized electron speckle spectrum[J]. Journal of Applied Optics, 2010, 31(2): 263-266. |
[1]于美文,张存林,杨永源.全息记录材料及其应用[M].北京: 高等教育出版社,1997.
YU Mei-wen,ZHANG Cun-lin, YANG Yong-yuan. The total information recording material and applies[M]. Beijing: Higher Education Press,1997.(in Chinese) [2]吴君君,宋伟,段晓飞.基于电子散斑干涉技术的圆度误差测量方法[J]. 激光杂志, 2009,2:51-52. WU Jun-jun, SONG Wei, DUAN Xiao-fei. Method of measuring roundness error based on ESPI[J]. Laser Journal, 2009,2:51-52.(in Chinese with an English abstract) [3]马志芳,高秀梅, 孙平.基于迈克尔逊干涉的傅里叶变换散斑形貌测量技术[J].应用光学,2008,29(6):874-877. MA Zhi-fang, GAO Xiu-mei, SUN Ping. Fourier-transform speckle profilometry based on Michelson interference[J]. Journal of Applied Optics, 2008,29(6):874-877.(in Chinese with an English abstract) [4]孙平.单幅对称变形相位图分离二维变形分量的相移电子散斑干涉技术[J].光子学报,2008,37(2):337-339. SUN Ping. Isolation of two dimensional displa-cement components of symmetrical deformation by using one phase map in phase-shifting electronic speckle pattern interferometry[J]. Acta Photonica Sinica,2008,37(2):337-339.(in Chinese with an English abstract) [5]宋凡峰,王开福,郑蓝.电子散斑相位检测的滤波方法研究[J]. 激光杂志,2007, 28(3):50-51. SONG Fan-feng, WANG Kai-fu, ZHENG Lan. Investigation of filtering method for phase measurement in electronic speckle pattern interferometry (ESPI)[J].Laser Journal, 2007,28(3):50-51.(in Chinese with an English abstract) [6]高秀梅,孙平,郭洪英,等.单幅相位图的二维位移分离技术与图像处理[J]. 山东师范大学学报:自然科学版,2007,22(1):46-48. GAO Xiu-mei,SUN Ping,GUO Hong-ying,et al. Isolation of two dimensional displament for one phase map and image management[J]. Journal of Shandong Normal University(Natural Science),2007,22(1):46-48.(in Chinese with an English abstract) [7]刘艳,丁万山.光学剪切电子散斑技术的改进与应用[J].激光与光电子学进展, 2006,43(6): 47-51. LIU Yan,DING Wan-shan. Improvement and application of optical shearography[J]. Laser & Optoelectronics Progress, 2006,43(6): 47-51.(in Chinese with an English abstract) [8]周文静,于瀛洁.基于光纤的三维电子散斑干涉测量系统设计[J]. 光学精密工程,2008,16(10):1815-1821. ZHOU Wen-jing,YU Ying-jie. Design of 3D ESPI system by optical fiber[J]. Optics and Precision Engineering,2008,16(10):1815-1821.(in Chinese with an English abstract) |
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