姜昌录, 袁良, 汪建刚, 李辉, 王生云, 康登魁, 杨朋利, 王雷. 光电成像系统动态调制传递函数测量装置[J]. 应用光学, 2021, 42(4): 592-596. DOI: 10.5768/JAO202142.0401004
引用本文: 姜昌录, 袁良, 汪建刚, 李辉, 王生云, 康登魁, 杨朋利, 王雷. 光电成像系统动态调制传递函数测量装置[J]. 应用光学, 2021, 42(4): 592-596. DOI: 10.5768/JAO202142.0401004
JIANG Changlu, YUAN Liang, WANG Jian’gang, LI Hui, WANG Shengyun, KANG Dengkui, YANG Pengli, WANG Lei. Dynamic modulation transfer function measuring device for photoelectric imaging system[J]. Journal of Applied Optics, 2021, 42(4): 592-596. DOI: 10.5768/JAO202142.0401004
Citation: JIANG Changlu, YUAN Liang, WANG Jian’gang, LI Hui, WANG Shengyun, KANG Dengkui, YANG Pengli, WANG Lei. Dynamic modulation transfer function measuring device for photoelectric imaging system[J]. Journal of Applied Optics, 2021, 42(4): 592-596. DOI: 10.5768/JAO202142.0401004

光电成像系统动态调制传递函数测量装置

Dynamic modulation transfer function measuring device for photoelectric imaging system

  • 摘要: 在光电成像系统中,动态调制传递函数受到光学系统波像差、探测组件信号分辨率及传递特性以及载体运动引起图像模糊等环节对图像质量的综合影响,成为光电成像系统的重要参数之一。论文基于光电成像系统动静态调制传递函数的测试原理,研制一种动态调制传递函数测量装置,其中光学准直系统焦距为10 000 mm,运动目标速度控制范围达到30 mm/s~5 000 mm/s,满足长焦距光电成像系统的动态调制传递函数测试。利用该装置进行了一系列的实验研究,结果表明,动态调制传递函数测量重复性优于0.01,测量不确定度达到U=0.05(k=2)。

     

    Abstract: In the optical imaging system, the dynamic modulation transfer function (DMTF) is affected by the wave aberration of optical system, the signal resolution and transfer characteristics of detector modules, and the image blur caused by the carrier motion, which has become one of the important parameters of the photoelectric imaging system. Based on the testing principle of dynamic and static modulation transfer function of photoelectric imaging system, a DMTF measuring device was developed, in which the focal length of optical collimation system was 10 000 mm, and the speed control range of moving target was 30 mm/s~5 000 mm/s, which met the DMTF test of photoelectric imaging system with long focal length. A series of experiments were carried out, and the results show that the repeatability of DMTF measurement is better than 0.01, and the uncertainty of measurement can reach to U= 0.05 (k=2).

     

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