雷志锋, 杨少华, 黄云. 高功率半导体激光器的可靠性与寿命评价[J]. 应用光学, 2008, 29(1): 90-95.
引用本文: 雷志锋, 杨少华, 黄云. 高功率半导体激光器的可靠性与寿命评价[J]. 应用光学, 2008, 29(1): 90-95.
LEI Zhi-feng, YANG Shao-hua, HUANG Yun. Reliability and lifetime assessment of high-power diode laser[J]. Journal of Applied Optics, 2008, 29(1): 90-95.
Citation: LEI Zhi-feng, YANG Shao-hua, HUANG Yun. Reliability and lifetime assessment of high-power diode laser[J]. Journal of Applied Optics, 2008, 29(1): 90-95.

高功率半导体激光器的可靠性与寿命评价

Reliability and lifetime assessment of high-power diode laser

  • 摘要: 介绍了高功率半导体激光器的结构特点、失效机理和热产生机制等方面的内容。就寿命评价方面展开讨论,详细分析了高功率半导体激光器寿命评价的难点、现有方法以及国内外发展状况,最后就寿命评价系统及寿命试验提出了一些建议。高功率半导体激光器在工业加工、国防航天等领域的巨大应用前景推动其可靠性与寿命的发展,而其可靠性的提高和寿命的延长会大大拓宽其应用领域。

     

    Abstract: The configuration, failure mechanism and heat generation mechanism of highpower diode laser (HDL) are described. The lifetime assessment is discussed, including the methods used and the difficulties encountered in the assessment. The status quo of such assessment at home and abroad is given. Some suggestions on lifetime assessment and test are given. The development of reliability and lifetime test for high power diode laser is promoted by its application in civilian industry, military and space filed. With the increasing of reliability and lifetime, high power diode laser will find more applications.

     

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