CHEN Jie-chun, ZHAO Li-ping, GUO ming. Uncertainty evaluation of corner detection[J]. Journal of Applied Optics, 2011, 32(3): 477-481.
Citation: CHEN Jie-chun, ZHAO Li-ping, GUO ming. Uncertainty evaluation of corner detection[J]. Journal of Applied Optics, 2011, 32(3): 477-481.
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Uncertainty evaluation of corner detection

  • 1.

    College of Automation Engineering,Northeast Dianli University,Jilin 132012,China;

  • 2.

    College of Science,Northeast Dianli University,Jilin 132012,China

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    • Abstract
  • This paper proposes a new method for uncertainty evaluation of corner detection. A mathematical model which relates the uncertainty of pixel intensity with the pixel intensity and image gradient is presented. To evaluate the uncertainty of corner detection, the uncertainty associated with the intensity of each pixel, which belongs to the target to be detected, is evaluated by using the mathematical model presented in the paper. Then the uncertainties associated with the output of a corner detector are evaluated by using Monte Carlo Simulation. The method was validated by using classical SUSAN corner detector as an example. The experimental results show that the uncertainty of corner detection can be evaluated accurately using this method.
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    • References (1)
  • ［1］ZHENG Z, WANG H, KHWANG TEOH E. Analysis of gray level corner detection ［J］. Pattern Recognition Letters, 1999, 20(2): 149-162.

    ［2］COX M G, HARRIS P M. Best practice guide No.6: Uncertainty and statistical modelling ［R］. Teddington: National Physical Laboratory, 2004.

    ［3］TIAN H, FOWLER B, EL GAMAL A. Analysis of temporal noise in CMOS photodiode active pixel sensor ［J］. IEEE Journal of Solid-State Circuits, 2001, 36(1): 92-101.

    ［4］DE SANTO M, LIGUORI C, PAOLILLO A, et al. Standard uncertainty evaluation in image-based measurements ［J］. Measurement: Journal of the International Measurement Confederation, 2004, 36(3-4): 347-358.

    ［5］MATT STEELE R, JAYNES C. Feature uncertainty arising from covariant image noise［C］. United States: IEEE Computer Society, 2005：1063-1070.

    ［6］DE SANTO M, LIGUORI C, PIETROSANTO A. Uncertainty characterization in image-based measurements: a preliminary discussion ［J］. IEEE Transactions on Instrumentation and Measurement, 2000, 49(5): 1101-1107.

    ［7］DE SANTO M, LIGUORI C, PIETROSANTO A. Uncertainty in image based measurements: A step towards model characterization［C］. United States: IEEE, 2000：365-369.

    ［8］SMITH S M, BRADY J M. SUSAN - a new approach to low level image processing ［J］. International Journal of Computer Vision, 1997, 23(1): 45-78.
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