CHEN Sheng-shi, OU Qiu-ye, NING Zi-li, XUE Chang-jia, JI Ming, ZHOU Li-hua, ZHANG Xiao-hui. Test setup for high power narrow pulsese miconductor laser[J]. Journal of Applied Optics, 2009, 30(4): 712-716.
Citation: CHEN Sheng-shi, OU Qiu-ye, NING Zi-li, XUE Chang-jia, JI Ming, ZHOU Li-hua, ZHANG Xiao-hui. Test setup for high power narrow pulsese miconductor laser[J]. Journal of Applied Optics, 2009, 30(4): 712-716.

Test setup for high power narrow pulsese miconductor laser

  • According to the special test request of the laser guidance system for the high power narrow pulse semiconductor lasers, a test setup for testing peak optical power output, threshold current, forward voltage, rise time, peak wavelength and spectrum width of the high power narrow pulse semiconductor lasers was developed. The setup consists of the miniaturization power-amplification module of high-power actuator, large-scale adjustable DC-DC module, signal generator, collimating mirror, laser peak power meter, laser spectrum analyzer and CCD pickup camera. The peak power of emission, peak wavelength of emission, wavelength drift characteristic with temperature and luminous core uniformity of high power narrow pulse semiconductor lasers can be tested. The features of the test setup are presented and the test results are elaborated.
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