Citation: | HU Tie-li, LI Xu-dong, FU Jian-ming, XUE Zhan-li, YUE Wen-long. Doubleblackbody unit for measuring parameters of infrared cameras[J]. Journal of Applied Optics, 2006, 27(3): 246-249. |
[1] | ZHANG Liwei, CHEN Haobo, BAO Haiyu, WU Xingzhi, SUN Wenqing, WU Quanying. Spatiotemporal phase-shifting method for interferograms of apertures with arbitrary shape[J]. Journal of Applied Optics, 2023, 44(5): 1080-1087. DOI: 10.5768/JAO202344.0503004 |
[2] | CAI Yawen, ZHANG Qingjun, LIU Jie, ZHANG Yue, LIU Jiuli. Multi-degree of freedom acquisition system based on wide-spectrum phase-shifting interferometry[J]. Journal of Applied Optics, 2021, 42(5): 775-781. DOI: 10.5768/JAO202142.0501003 |
[3] | XU Junyi, YUAN Qun, GAO Zhishan, XU Yao. Profile measurement of red blood cells based on simultaneous phase-shifting microscopic interference[J]. Journal of Applied Optics, 2020, 41(5): 1020-1025. DOI: 10.5768/JAO202041.0503003 |
[4] | YU Zihao, LIU Jin, YANG Haima, LI Meiying, XU Wei, XU Bin. Research on 3D measurement and reconstruction of high-precision profile of multi-frequency grating object[J]. Journal of Applied Optics, 2020, 41(3): 580-585. DOI: 10.5768/JAO202041.0303006 |
[5] | WANG Lin, HAN Xu, FU Yanjun, HUANG Chunzhi, SHI Yaoqun. Fast phase unwrapping algorithm for 3D measurement[J]. Journal of Applied Optics, 2019, 40(2): 271-277. DOI: 10.5768/JAO201940.0202005 |
[6] | Qiu Lei, Qian Bin, Fu Yanjun, Zhong Kejun. Three-dimensional shape measurement method based on sinusoidal and triangular fringe projection[J]. Journal of Applied Optics, 2018, 39(4): 522-527. DOI: 10.5768/JAO201839.0403002 |
[7] | Zeng Zhuohuan, Huang Chao, Qu Guoli, Fu Yanjun. 3D measurement method based on binary fringe plusphase coding fringe defocus projection[J]. Journal of Applied Optics, 2017, 38(5): 790-797. DOI: 10.5768/JAO201738.0503003 |
[8] | Shang Zhong-yi, Li Wei-xian, Dong Ming-li, Duan Liang-jun. 3D shape measurement system based on fringe projection in 4-step phase shifting[J]. Journal of Applied Optics, 2015, 36(4): 584-589. DOI: 10.5768/JAO201536.0403005 |
[9] | SHI Yi-lei, SU Jun-hong, YANG Li-hong, XU Jun-qi. Measuring thin-film thickness with phase-shift interferometry[J]. Journal of Applied Optics, 2009, 30(1): 76-79. |
[10] | ZHU Ri-hong, CHEN Lei, WANG Qing, GAO Zhi-shan, HE Yong. Phase shift interferometry and its application[J]. Journal of Applied Optics, 2006, 27(2): 85-88. |