WANG Cheng-yang, CHEN Zhi-bin, ZHUO Jia-jing, HOU Zhang-ya. Comprehensive test technology of pulsed laser peak power in common wavebands[J]. Journal of Applied Optics, 2007, 28(1): 72-76.
Citation: WANG Cheng-yang, CHEN Zhi-bin, ZHUO Jia-jing, HOU Zhang-ya. Comprehensive test technology of pulsed laser peak power in common wavebands[J]. Journal of Applied Optics, 2007, 28(1): 72-76.
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Comprehensive test technology of pulsed laser peak power in common wavebands

  • Ordnance Engineering College,Shijiazhuang 050003,China

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    WANG Cheng-yang

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    • Abstract
  • The comprehensive test technology for laser peak power parameter is investigated based on the characteristics of wavelength, power, and pulse width of pulse laser transmitted from laser transmitting sets operating in several common wavebands. Utilizing the self-developed universal test platform, the corresponding high sensitivity detectors are selected for different wavelengths, suitable attenuating plates are adopted for different power ranges, and the proper widening magnifications and fast discharge circuits are designed for narrower laser pulses with the advanced technology of multiband optronic detection, integrated assembled optical design and circuit design. Experimental results indicate that the technology is an effective way to implement the comprehensive test of the multiband laser peak power.
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