CHEN Wen-jian, WU Feng-bo. Measurement technology of three-dimensional outline based on ray tracing[J]. Journal of Applied Optics, 2008, 29(supp): 72-75.
Citation: CHEN Wen-jian, WU Feng-bo. Measurement technology of three-dimensional outline based on ray tracing[J]. Journal of Applied Optics, 2008, 29(supp): 72-75.

Measurement technology of three-dimensional outline based on ray tracing

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  • Corresponding author:

    CHEN Wen-jian

  • Aiming at the problems difficult to operate the measurement system and calibrate a system in conventional 3-D outline measurement, a new method to measure 3-D outline of an object based on projected fringe patterns is proposed. The measurement principle of the system is presented. The calibration method of CCD camera and calibration process of the projector are discussed. An idea to solve the spatial coordinates with phase matching is proposed. The restraint of parallelism and perpendicularity of conventional structures was eliminated. The system calibration and measurement process are simple, and easy to be realized in engineering. Theoretical analysis and measurement results show that the technology is robust and available.
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