XU Rong-guo, WANG Lei, YIN Wan-hong, YANG Zhao-jin. Measuring method of temperature coefficient of infrared optical material transmittance[J]. Journal of Applied Optics, 2013, 34(6): 1000-1004.
Citation: XU Rong-guo, WANG Lei, YIN Wan-hong, YANG Zhao-jin. Measuring method of temperature coefficient of infrared optical material transmittance[J]. Journal of Applied Optics, 2013, 34(6): 1000-1004.

Measuring method of temperature coefficient of infrared optical material transmittance

More Information
  • A new transmittance measurement and assessment method of the infrared optical material at diffident temperatures was proposed. A collimation reflect mirror was used to make the infrared light source into the parallel light, and then a chopper was used to make the continuous light into the pulse light, besides, a special wavelength was obtained by filter. A special data acquisition system that including a preamplifier circuit, a lock-in amplifier, a computer and a control software could calculate the value of infrared transmittance and give the temperature coefficient of the optical material by means of double light beam contrast measurement. The method resolved problems of infrared transmittance measurement of optical material in actual operational environment, like high temperature. Test result shows the transmittance of sapphire material is higher than 10% at the wavelength of 519 5 nm, and the repeatability is better that 0.2% from room temperature up to 700℃. The method has great economic and social utility.
  • [1]熊长新,杨林峰高透过率红外窗口保护薄膜的研制[J]光学与光电技术,2009,7(6):45-47
    XIONG Chang-xin, YANG Lin-feng-Deposition of high transmittance protective coatings on IR windows[J].Optics and Optoelectronic Technology, 2009,7(6):45-47.(in Chinese with an English abstract)
    [2]王雷,王生云,侯西琪,等.红外光学材料参数测试[J].应用光学,2001,22(6):40-43.
    WANG Li,WANG Sheng-yun,HOU Xi-qi,et al.Parameter testing of infrared optical material[J].Journal of Applied Optics,2001,22(6):40-43.(in Chinese with an English abstract)
    [3]RAINE K W,PENFOLD A B.An instrument for measuring the thermal coefficient of refraction index in the infrared[J].Phys. E Sci. Instrum,1985,18:593-595.
    [4]RAINE K W,KIBBLE A E L.Measurement of the thermal coefficient of refraction index of solid materials in the wavelength range 3 μm to 5 μm[R]. UK:NPL, 1992.
    [5]KUTSAY O M,GORSGTEIN B A. Diamond-like carbon films in multilayered influence coatings for IR optical elements[J].Diamond and Related Materials,2001(10):1846-1848.
    [6]NOVIKOY N V,GONTAR A G.Protective diamond-like carbon coatings for optical materials and electronic devices[J].Diamond and Related Materials,2000(9):792-795.
    [7]李国强,介万奇,华惠.根据红外透过率推断CdZnTe晶片的性能[J].红外与毫米波学报,2003,22(6):469-472.
       LI Guo-qiang,QIAO Wan-qi,HUA Hui.Deducing the properties of CdZnTe wafers by IR transmission[J].Journal of Infrared and Millimeter Waves,2003,22(6):469-472.(in Chinese with an English abstract)
    [8]张洋,张记龙,杜宣燕.基于HgCdTe红外探测器的微弱信号检测电路设计[J].应用光学,2011,32(4):779-783.
       ZHANG Yang,ZHANG Ji-long,DU Xuan-yan.Weak signal detection circuit based on HgCdTe IR detector[J].Journal of Applied Optics,2011,32(4):779-783.(in Chinese with an English abstract)
    [9]卫翠玉,胡炳樑,邵秀娟,等.ORCAD在HgCdTe红外探测器放大电路低噪声设计中的应用[J].电子器件,2009,32(2):324-328.
       WEI Cui-yu,HU Bing-liang,SHAO Xiu-jian,et al.Reseach on low noise design of HgCdTe infrared detector amplifying circuit based on ORCAD[J].Chinese Journal Of Electron Devices,2009,32(2):324-328.(in Chinese with an English abstract)
    [10]肖寅东,赵辉,王厚军.基于锁相放大的微弱信号检测电路前置滤波器设计[J].测控技术,2007,26(3):86-88.
    XIAO Yin-dong,ZHAO Hui,WANG Hou-jin.Perfilter design method for weak signal detection with LIA[J].Control Technology,2007,26(3):86-88.(in Chinese with an English abstract)

Catalog

    Article views (2324) PDF downloads (437) Cited by()

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return