HAN Wen-qin, GUO Xi-qing, XIE Guan-bao, SUN Peng-fei, YANG Jing-xian, TANG Ya-jun. Pulse laser damage characteristic measurement of VO2 optical thin film[J]. Journal of Applied Optics, 2013, 34(4): 690-694.
Citation: HAN Wen-qin, GUO Xi-qing, XIE Guan-bao, SUN Peng-fei, YANG Jing-xian, TANG Ya-jun. Pulse laser damage characteristic measurement of VO2 optical thin film[J]. Journal of Applied Optics, 2013, 34(4): 690-694.

Pulse laser damage characteristic measurement of VO2 optical thin film

  • In order to evaluate the operational reliability of the VO2 optical film working in the photovoltaic device, a pulse laser experiment platform which could output gradient laser energy density was set up. The laser irradiation experiment was carried out by using the1 to 1 and s to 1 laser damage test means, and the results were processed through the methods of extrapolation and measureme calculation. The experiment obtained the damage characteristics of VO2 thin films under the pulsed laser with a repetition rate of 10 kHz, center wavelength of 532 nm and pulse width of 15 ps. The results indicate that there is a linear relationship between the damage probability of VO2 thin films and the energy density of the single laser pulse, moreover, the damage caused by the laser pulse repeated radiation has the cumulative effect, and the more times laser pulse radiation repeats, the more obvious the cumulative effect of damage is.
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