WEI Dong, SANG Mei, YU Minhui, HUANG Yaokang, LIU Hongguang, LIU Tiegen. Defect detection algorithm of MEMS acoustic film based on frequency domain transformation[J]. Journal of Applied Optics, 2021, 42(6): 1086-1091. DOI: 10.5768/JAO202142.0603005
Citation: WEI Dong, SANG Mei, YU Minhui, HUANG Yaokang, LIU Hongguang, LIU Tiegen. Defect detection algorithm of MEMS acoustic film based on frequency domain transformation[J]. Journal of Applied Optics, 2021, 42(6): 1086-1091. DOI: 10.5768/JAO202142.0603005

Defect detection algorithm of MEMS acoustic film based on frequency domain transformation

More Information
  • Received Date: April 24, 2021
  • Revised Date: May 08, 2021
  • Available Online: August 29, 2021
  • The micro-electro-mechanical system (MEMS) acoustic film has extremely high requirements for tape-out, storage and packaging environments, and its surface defects will affect the quality and performance of MEMS devices. The image defects detection is an effective non-contact optical detection means that can effectively improve the yield rate of MEMS production. However, the periodic structure texture of the MEMS devices surface will interfere with defect detection. A acoustic film defect detection algorithm based on frequency domain transformation was proposed. By calculating the gradient distribution of spectrogram and establishing the Boolean mask, the dominant frequency components corresponding to the periodic structure texture were eliminated. The residual spectrograms were subjected to a Fourier inversion to reconstruct the defect images. The reconstructed images were decomposed by single-layer Haar wavelet to obtain the low-frequency sub-band image and the defect information was extracted by simple threshold segmentation. The defect detection effects of different types of MEMS acoustic film were showed. The experimental results show that it is reasonable to set the zoom constant in the range of 0.7~1.0.
  • [1]
    宋宇, 张海霞. 微电子机械系统研究领域的最新进展——IEEE MEMS 2018国际会议综述[J]. 太赫兹科学与电子信息学报,2018,16(2):372-378.

    SONG Yu, ZHANG Haixia. The latest progress in the research field of MEMS—Overview of IEEE MEMS 2018 International Conference[J]. ,2018,16(2):372-378.
    [2]
    申小萌. MEMS技术在电子通信产业中的意义初探[J]. 中国新通信,2016,18(7):98-99. doi: 10.3969/j.issn.1673-4866.2016.07.074

    SHEN X M. The significance of MEMS technology in electronic communication industry[J]. China New Telecommunications,2016,18(7):98-99. doi: 10.3969/j.issn.1673-4866.2016.07.074
    [3]
    宗艳芬. 基于计算机视觉的微小零件质量检测系统和方法研究[D]. 哈尔滨: 哈尔滨理工大学, 2017.

    ZONG Yanfen. The quality detection system and method of computer based on microscopic vision[D]. Harbin: Harbin University of Science and Technology, 2017.
    [4]
    XIE Xianghua. A review of recent advances in surface defect detection using texture analysis techniques[J]. ELCVIA Electronic Letters on Computer Vision and Image Analysis,2008,7(3):1-22. doi: 10.5565/rev/elcvia.268
    [5]
    PAN Zhongliang, CHEN Ling, ZHANG Guangzhao. IC wafer defect detection using image segmentation based on cultural algorithms[J]. SPIE,2008,7130:713046-1-6.
    [6]
    HU Guanghua, WANG Qinghui, ZHANG Guohui. Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage[J]. Applied Optics,2015,54(10):2963-2980. doi: 10.1364/AO.54.002963
    [7]
    刘西峰. 基于图像配准的晶圆表面缺陷检测[J]. 仪器仪表与分析监测,2020(3):1-4. doi: 10.3969/j.issn.1002-3720.2020.03.001

    LIU Xifeng. Inspection of IC wafer defects based on image[J]. Instrumentation·Analysis·Monitoring,2020(3):1-4. doi: 10.3969/j.issn.1002-3720.2020.03.001
    [8]
    TSAI D M, WU S C, LI W C. Defect detection of solar cells in electroluminescence images using Fourier image reconstruction[J]. Solar Energy Materials and Solar Cells,2012,99:250-262. doi: 10.1016/j.solmat.2011.12.007
    [9]
    刘丽, 匡纲要. 图像纹理特征提取方法综述[J]. 中国图象图形学报,2009,14(4):622-635. doi: 10.11834/jig.20090409

    LIU Li, KUANG Gangyao. Overview of image textural feature extraction methods[J]. Journal of Image and Graphics,2009,14(4):622-635. doi: 10.11834/jig.20090409
    [10]
    HARIKUMAR R, VINOTH KUMAR B. Performance analysis of neural networks for classification of medical images with wavelets as a feature extractor[J]. International Journal of Imaging Systems and Technology,2015,25(1):33-40. doi: 10.1002/ima.22118
    [11]
    HU Guanghua. Optimal ring Gabor filter design for texture defect detection using a simulated annealing algorithm[C]//2014 International Conference on Information Science, Electronics and Electrical Engineering. April 26-28, 2014, Sapporo, Japan: IEEE, 2014: 860-864.
    [12]
    丛家慧, 颜云辉, 董德威. Gabor滤波器在带钢表面缺陷检测中的应用[J]. 东北大学学报(自然科学版),2010,31(2):257-260. doi: 10.3969/j.issn.1005-3026.2010.02.027

    CONG Jiahui, YAN Yunhui, DONG Dewei. Application of Gabor filter to strip surface defect detection[J]. Journal of Northeastern University (Natural Science),2010,31(2):257-260. doi: 10.3969/j.issn.1005-3026.2010.02.027
    [13]
    JING Junfeng, CHEN Shan, LI Pengfei. Fabric defect detection based on golden image subtraction[J]. Coloration Technology,2017,133(1):26-39. doi: 10.1111/cote.12239
    [14]
    TSAI Z D, PERNG M H. Defect detection in periodic patterns using a multi-band-pass filter[J]. Machine Vision and Applications,2013,24(3):551-565. doi: 10.1007/s00138-012-0425-5
    [15]
    OTSU N. A threshold selection method from gray-level histograms[J]. IEEE Transactions on Systems, Man, and Cybernetics,1979,9(1):62-66. doi: 10.1109/TSMC.1979.4310076
  • Cited by

    Periodical cited type(2)

    1. 李聪,谭明,刘小标,李辉. 基于稀疏成像的半导体薄膜材料界面缺陷检测. 计算机仿真. 2024(01): 197-200+226 .
    2. 邱忠阳,冯瑞姝,郝淑娟. 大功率半导体激光器光学膜损伤检测系统研究. 激光杂志. 2023(02): 201-204 .

    Other cited types(3)

Catalog

    Article views (547) PDF downloads (35) Cited by(5)

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return