Single test error analysis for integral sensitivity of low-light-level image intensifier

In order to improve the test speed of performance parameter for lot size of low-level-light (LLL) image intensifiers, the single test data is usually used as the measurement result. In this case, the error of parameter single test result will directly determine the accuracy of the performance evaluation result. The parameter test of integral sensitivity for LLL image intensifiers was taken as an example to evaluate the single test error. Based on the comprehensive analysis of the errors of test method, measuring device, data calculation and so on for the integral sensitivity of LLL image intensifiers, the single test maximum error of integral sensitivity was calculated to 6.7%. On this basis, the single test error control scheme of integral sensitivity using a diaphragm with higher processing accuracy, corrected incident illuminance measurement position, and stage auxiliary parameter repeatability measurement calibration was proposed. The research results have important guiding significance and reference value for the rapid test of lot size of LLL image intensifiers.