Citation: | SHI Kai, SU Junhong, QI Yuan. Method of thin film thickness measurement based on laser heterodyne interferometry[J]. Journal of Applied Optics, 2019, 40(3): 473-477. DOI: 10.5768/JAO201940.0303003 |
[1] |
戴蓉, 谢铁邦, 常素萍.垂直扫描白光干涉表面三维形貌测量系统[J].光学技术, 2006, 32(4):545-548. http://d.old.wanfangdata.com.cn/Periodical/gxjs200604011
DAI Rong, XIE Tiebang, CHANG Suping. A vertical scanning white-light interfering profilometer[J]. Optical Technique, 2006, 32(4):545-548. http://d.old.wanfangdata.com.cn/Periodical/gxjs200604011
|
[2] |
陈凯, 崔明启, 郑雷, 等.nm量级薄膜厚度测量[J].强激光与粒子束, 2008(2):234-238. http://d.old.wanfangdata.com.cn/Periodical/qjgylzs200802012
CHEN Kai, CUI Mingqi, ZHENG Lei, et al. Layer thickness measurement of super thin films[J]. High Power Laser and Particle Beams, 2008(2):234-238. http://d.old.wanfangdata.com.cn/Periodical/qjgylzs200802012
|
[3] |
郭志峰, 郭昭华, 王永旺, 等.原子力显微镜和白光干涉仪在表面材料测试中的应用研究[J].表面技术, 2018, 47(1):254-259. http://d.old.wanfangdata.com.cn/Periodical/bmjs201801040
GUO Zhifeng, GUO Zhaohua, WANG Yongwang, et al. Application of atomic force microscope and white light interferometer in surface material tests[J]. Surface Technology, 2018, 47(1):254-259. http://d.old.wanfangdata.com.cn/Periodical/bmjs201801040
|
[4] |
王长军, 熊胜明.大口径光学元件薄膜厚度均匀性修正[J].强激光与粒子束, 2007(7):1153-1157. http://d.old.wanfangdata.com.cn/Periodical/qjgylzs200707022
WANG Changjun, XIONG Shengming. Correction for film thickness uniformity of large aperture optical components[J]. High Power Laser and Particle Beams, 2007(7):1153-1157. http://d.old.wanfangdata.com.cn/Periodical/qjgylzs200707022
|
[5] |
程敏, 艾力·伊沙木丁, 孙正文, 等.大口径非球面镀膜均匀性分析与修正挡板设计[J].真空科学与技术学报, 2017, 37(3):250-254. http://d.old.wanfangdata.com.cn/Periodical/zkkx201703002
CHENG Min, ALI E, SUN Zhengwen, et al. Novel correction mask for thickness uniformity improvement of coatings on large aperture aspheric surface[J]. Chinese Journal of Vacuum Science and Technology, 2017, 37(3):250-254. http://d.old.wanfangdata.com.cn/Periodical/zkkx201703002
|
[6] |
梁海锋, 严一心.类金刚石薄膜光学特性的椭偏法研究[J].真空科学与技术学报, 2005(4):287-289. doi: 10.3969/j.issn.1672-7126.2005.04.013
LIANG Haifeng, YAN Yixin. Study on optical properties of diamond-like carbon with ellipsometry[J]. Journal of Vacuum Science and Technology, 2005(4):287-289. doi: 10.3969/j.issn.1672-7126.2005.04.013
|
[7] |
马逊, 刘祖明, 陈庭金, 等.椭圆偏振仪测量薄膜厚度和折射率[J].云南师范大学学报(自然科学版), 2005(4):24-27. doi: 10.3969/j.issn.1007-9793.2005.04.006
MA Xun, LIU Zuming, CHEN TingJin, et al. Thin film material thickness and refractive index measurement by elliptical polarization instrument[J]. Journal of Yunan Normal University(Natural Sciences Edition), 2005(4):24-27. doi: 10.3969/j.issn.1007-9793.2005.04.006
|
[8] |
范江玮, 王锋, 孙钦蕾, 等.多层模型计算椭偏法测量的SiO2/Si超薄膜厚度[J].测试技术学报, 2012, 26(5):388-392. doi: 10.3969/j.issn.1671-7449.2012.05.004
FAN Jiangwei, WANG Feng, SUN Qinlei, et al. The thickness determination of SiO2/Si ultra-thin film by spectroscopic ellipsometry through multilayer[J]. Journal of Test and Measurement Technology, 2012, 26(5):388-392. doi: 10.3969/j.issn.1671-7449.2012.05.004
|
[9] |
黎永前, 李晓莹, 朱名铨.纳米精度外差式激光干涉仪非线性误差修正方法研究[J].仪器仪表学报, 2005(5):542-546. doi: 10.3321/j.issn:0254-3087.2005.05.027
LI Yongqian, LI Xiaoying, ZHU Mingquan. A new method to correct the nonlinear errors in heterodyne interferometry[J]. Chinese Journal of Scientific Instrument, 2005(5):542-546. doi: 10.3321/j.issn:0254-3087.2005.05.027
|
[10] |
侯文玫, 张运波, 乐燕芬, 等.外差激光干涉测长非线性误差的消除[J].中国激光, 2012, 39(9):162-167. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=zgjg201209029
HOU Wenmei, ZHANG Yunbo, LE Yanfen, et al. Elimination of the nonlinearity of heterodyne displacement interferometers[J]. Chinese Journal of Lasers, 2012, 39(9):162-167. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=zgjg201209029
|
[11] |
钟朝阳, 侯文玫, 句爱松, 等.双频激光干涉仪的混频分析与研究[J].光学技术, 2015, 41(2):119-123. http://d.old.wanfangdata.com.cn/Periodical/gxjs201502006
ZHONG Chaoyang, HOU Wenmei, JU Aisong, et al. Analysis of frequency mixing in dual-frequency interferometer[J]. Optical Technique, 2015, 41(2):119-123. http://d.old.wanfangdata.com.cn/Periodical/gxjs201502006
|
[12] |
石一磊, 苏俊宏, 杨利红, 等.基于相位偏移干涉术的薄膜厚度测量方法[J].应用光学, 2009, 30(1):76-79, 83. doi: 10.3969/j.issn.1002-2082.2009.01.018
SHI Yilei, SU Junhong, YANG Lihong, et al. Measuring thin-film thickness with phase-shift interferometry[J]. Journal of Applied Optics, 2009, 30(1):76 -79, 83. doi: 10.3969/j.issn.1002-2082.2009.01.018
|
[13] |
苏俊宏, 刘奕辰.测量薄膜厚度的数字叠栅技术[J].中国激光, 2012, 39(11):104-108. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=zgjg201211020
SU Junhong, LIU Yichen. Digital Moiré technique for thin film thickness measurement[J]. Chinese Journal of Lasers, 2012, 39(11):104-108. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=zgjg201211020
|
[14] |
HOU W M, GUNTER W. Investigation and compensation of the nonlinearity of heterodyne interferometers[J]. Precision Engineering, 1992, 14(1):91-98. http://cn.bing.com/academic/profile?id=e6f9855a0840c6397a1f98c9abdf2836&encoded=0&v=paper_preview&mkt=zh-cn
|
[15] |
SHI Kai, SU Junhong, HOU Wenmei. Roll angle measurement system based on differential plane mirror interferometer[J]. Optics Express, 2018, 26(16):19826-19834. doi: 10.1364/OE.26.019826
|
[16] |
乐燕芬, 句爱松.外差激光干涉仪非线性误差分析及测量[J].激光与光电子进展, 2016, 53(5):203-212. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=jgygdzxjz201605023
LE Yanfen, JU Aisong. Analysis and measurement of the nonlinear errors in heterodyne interferometers[J]. Laser & Optoelectronics Progress, 2016, 53(5):203-212. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=jgygdzxjz201605023
|
1. |
刘维慧,梁润泽,赵泉昕,卓朝博,苗永平. 双光源干涉法测量液态薄膜厚度. 大学物理实验. 2024(01): 31-36 .
![]() | |
2. |
易进,张瑞,薛鹏,卜韩,王志斌,李孟委. 基于弹光调制的椭偏测量驱动电路系统设计. 电子设计工程. 2024(04): 32-36+42 .
![]() | |
3. |
杨楠卓,欧阳名钊,周维虎,陈晓梅. 基于光谱反射技术的梯形刻面MEMS高深宽比沟槽深度测量仿真分析. 长春理工大学学报(自然科学版). 2020(02): 48-52+114 .
![]() | |
4. |
刘学聪,苗昕扬,詹洪磊,朱明达,张善哲,赵昆. 基于激光感生电压技术的咖啡粉粒径检测. 应用光学. 2020(05): 1117-1121 .
![]() | |
5. |
肖平平,王霏,邓满兰. 基于金属包覆波导结构的纳米间隙测量研究. 激光与光电子学进展. 2020(21): 273-277 .
![]() | |
6. |
肖平平,王霏,邓满兰,胡红武. 基于LSPR的非贵金属纳米薄膜厚度的精确测量. 光电子·激光. 2019(12): 1286-1290 .
![]() |