Simultaneous measurement of contour and micro-deformation using full-field optical methods

In practical engineering applications, contour and micro-deformation of materials and structures are essential parameters to be tested, and furthermore, usually need to be tested simultaneously. To meet this requirement, a method that combines digital speckle pattern interferometry (DSPI) and digital fringe projection (DFP) is proposed. An integrated optical setup is built by embedding a digital projector in the DSPI setup. With the new setup, surface contours and deformations can be measured simultaneously. The proposed method has the advantages of full-field, non-contact measurement, simple optical arrangement, ease of operation, high efficiency and reliability. The resolution of contour measurement is up to 10 μm, while the deformation measurement resolution is up to 30 nm.