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防离子反馈膜缺陷对像增强器视场的影响

郝子恒 孙超 李阳 杨凯莉 张妮 朱宇峰 李朋博 殷万鹏

郝子恒, 孙超, 李阳, 杨凯莉, 张妮, 朱宇峰, 李朋博, 殷万鹏. 防离子反馈膜缺陷对像增强器视场的影响[J]. 应用光学, 2022, 43(6): 1175-1180. doi: 10.5768/JAO202243.0604018
引用本文: 郝子恒, 孙超, 李阳, 杨凯莉, 张妮, 朱宇峰, 李朋博, 殷万鹏. 防离子反馈膜缺陷对像增强器视场的影响[J]. 应用光学, 2022, 43(6): 1175-1180. doi: 10.5768/JAO202243.0604018
HAO Ziheng, SUN Chao, LI Yang, YANG Kaili, ZHANG Ni, ZHU Yufeng, LI Pengbo, YIN Wanpeng. Effect of defects in ion barrier film on field of view of image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1175-1180. doi: 10.5768/JAO202243.0604018
Citation: HAO Ziheng, SUN Chao, LI Yang, YANG Kaili, ZHANG Ni, ZHU Yufeng, LI Pengbo, YIN Wanpeng. Effect of defects in ion barrier film on field of view of image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1175-1180. doi: 10.5768/JAO202243.0604018

防离子反馈膜缺陷对像增强器视场的影响

doi: 10.5768/JAO202243.0604018
基金项目: 国防基础科研项目(JCKY2018208B016)
详细信息
    作者简介:

    郝子恒(1990—),男,硕士,工程师,主要从事微通道板应用及噪声抑制技术研究。E-mail:hzh3157@126.com

    通讯作者:

    朱宇峰(1971—),男,硕士,研高工,主要从事微光像增强器方面的研究。E-mail:15384548728@163.com

  • 中图分类号: TN223

Effect of defects in ion barrier film on field of view of image intensifier

  • 摘要: 防离子反馈膜是三代微光像增强器的重要组成部分,其质量对像增强器的寿命和视场起着至关重要的作用。研究了防离子反馈膜质量对像增强器视场的影响。选取具有典型缺陷的防离子反馈微通道板(micro-channel plate,MCP),对防离子反馈微通道板在工作时的视场和防离子反馈膜质量进行分析,获得了防离子反馈膜的缺陷对微光像增强器工作时视场的影响。分析得到防离子反馈膜制备过程中缺陷产生的原因,并初步提出缺陷的解决方案,对后续制备出高质量防离子反馈膜有着非常积极的作用。
  • 图  1  防离子反馈微通道板检验系统原理图

    Fig.  1  Schematic diagram of inspection system for ion barrier MCP

    图  2  均匀、无缺陷点的防离子反馈微通道板的视场图

    Fig.  2  View diagram of ion barrier MCP with uniformity and no defects

    图  3  鼓泡缺陷视场图

    Fig.  3  View diagram of bubbling defect

    图  4  鼓泡缺陷目视图

    Fig.  4  Visual diagram of bubbling defect

    图  5  黑晕缺陷视场图

    Fig.  5  View diagram of black halo defect

    图  6  黑晕缺陷目视图

    Fig.  6  Visual diagram of black halo defect

    图  7  黑点缺陷视场图

    Fig.  7  View diagram of black spot defect

    图  8  放电缺陷视场图与目视图

    Fig.  8  View and visual diagram of electric discharge defect

    图  9  线状通孔缺陷视场图

    Fig.  9  View diagram of striped hole defect

    图  10  擦伤与划痕缺陷视场图

    Fig.  10  View diagram of graze defect and scratch defect

    图  11  电子清刷不均匀印迹视场图

    Fig.  11  View diagram of imprint with uneven electronic cleaning

    图  12  电子清刷能量过大的印迹视场图

    Fig.  12  View diagram of imprint with excessive-energy electronic cleaning

    表  1  典型缺陷防离子反馈微通道板样品

    Table  1  Samples of ion barrier MCP with typical defects

    编号样品1样品2样品3样品4样品5样品6样品7
    缺陷鼓泡黑晕黑点线状通孔擦伤划痕印迹
    下载: 导出CSV
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  • 被引次数: 0
出版历程
  • 收稿日期:  2022-08-08
  • 修回日期:  2022-09-13
  • 网络出版日期:  2022-09-23
  • 刊出日期:  2022-11-14

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