王学新, 岳文龙, 杨鸿儒, 谢毅. IRS400型材料发射率测试装置的研制[J]. 应用光学, 2015, 36(2): 272-276. DOI: 10.5768/JAO201536.0203006
引用本文: 王学新, 岳文龙, 杨鸿儒, 谢毅. IRS400型材料发射率测试装置的研制[J]. 应用光学, 2015, 36(2): 272-276. DOI: 10.5768/JAO201536.0203006
Wang Xue-xin, Yue Wen-long, Yang Hong-ru, Xie Yi. Development of measurement equipment for IRS400 type material emissivity[J]. Journal of Applied Optics, 2015, 36(2): 272-276. DOI: 10.5768/JAO201536.0203006
Citation: Wang Xue-xin, Yue Wen-long, Yang Hong-ru, Xie Yi. Development of measurement equipment for IRS400 type material emissivity[J]. Journal of Applied Optics, 2015, 36(2): 272-276. DOI: 10.5768/JAO201536.0203006

IRS400型材料发射率测试装置的研制

Development of measurement equipment for IRS400 type material emissivity

  • 摘要: 为了准确评估红外材料和涂层的隐身性能,研制了一套IRS400型材料发射率测试装置,主要用于温度范围(50~400)℃,光谱范围(3~5)m和(8~12)m的固体不透明材料和涂层定向发射率测量。给出IRS400型材料发射率测试装置的技术指标,阐述其工作原理,IRS400的光学系统采用全反射式设计,探测器选用钽酸锂热释电探测器,采用50 ℃~1 000 ℃黑体辐射源标准装置对黑体发射率B(1,2)进行标定。通过解决标定和环境温度补偿等关键技术,确保发射率测量不确定度小于2%(k=2)。

     

    Abstract: In order to accurately evaluate the stealth performance of infrared materials and coating, the IRS400 type material emissivity measurement equipment was developed . It is mainly used in the temperature range of 50 ℃~400 ℃, spectrum range of 3 m~5 m and 8 m~12 m directional measurement for the emissivity of solid opaque material and coating sample. The importance of the material emissivity measurement for infrared stealth technology was introduced, the IRS400 type emissivity measurement equipment was described, including the technology performance and working principle. The IRS400 optic system adopted total reflection design, the detector selected the LiTaO3 pyroelectric detector, and the 50 ℃~1 000 ℃ black body radiation source standard device was utilized to calibrate the black body emissivity B(1,2).By solving the key technology of calibration and environmental temperature compensation, the emissivity measurement uncertainty can be ensured less than 2%.

     

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