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极坐标系统下进行直角坐标扫描的离子束抛光

郭伟远 成贤锴

郭伟远, 成贤锴. 极坐标系统下进行直角坐标扫描的离子束抛光[J]. 应用光学, 2012, 33(1): 164-169.
引用本文: 郭伟远, 成贤锴. 极坐标系统下进行直角坐标扫描的离子束抛光[J]. 应用光学, 2012, 33(1): 164-169.
GUO Wei-yuan, CHENG Xian-kai. Ion beam polishing with scanning mode of rectangular coordinates in polar coordinates system[J]. Journal of Applied Optics, 2012, 33(1): 164-169.
Citation: GUO Wei-yuan, CHENG Xian-kai. Ion beam polishing with scanning mode of rectangular coordinates in polar coordinates system[J]. Journal of Applied Optics, 2012, 33(1): 164-169.

极坐标系统下进行直角坐标扫描的离子束抛光

详细信息
    通讯作者:

    郭伟远(1951-),男,山东东营人,研究员,主要从事真空镀膜和精密光学加工方面的研究工作。

  • 中图分类号: TN205

Ion beam polishing with scanning mode of rectangular coordinates in polar coordinates system

  • 摘要: 在离子束抛光设备研制过程中,离子源扫描运动方式的选择是很关键的,一般分为直角坐标方式扫描和极坐标方式扫描两种。根据两种扫描方式的特点,在极坐标系统下进行直角坐标扫描方式加工。该种方法采用直角坐标扫描方式下的驻留时间计算,算法相对简单。该种方法在极坐标系统下进行加工,同等情况下可加工圆形镜面的口径比直角坐标系统下更大些;而且离子源的可移动区域是一条直线,其余地方可以摆放其他设备,空间利用率较高。对这种新思路进行仿真分析,证实了其具有可行性。
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  • 刊出日期:  2012-02-15

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