[1]SNEH O, PHELPS R. Thin film atomic layer deposition equipment for semiconductor processing [J]. Thin Solid films, 2004, 402:248-252.
[2]CARCIA P F, MCLEAN R S, REILLY M H, et al. Ca test of Al2O3 gas diffusion barriers grown by atomic layer deposition on polymers [J]. Appl. Phys. Lett., 2006, 89: 031915.
[3]RITALA M, LESKELA M. Atomic layer epitaxy- a valuable tool for nanotechnology [J]. Nanotechnology, 1999, 10: 20-24.
[4]GERRY TRIANI, PETER J E, DAVID R G, et al. Atomic layer deposition of TiO2/ Al2O3 Films for Optical Applications[J]. SPIE, 2005, 5870: 1-10.
[5]JUSTIN E W, SAMUEL E S. Automated laser damage test system with Real-time damage event imaging and detection[J]. SPIE, 2007,6403:1-9.
[6]娄俊, 苏俊宏, 徐均琪,等. He-Ne散射光检测光学薄膜激光损伤阈值[J]. 应用光学, 2008, 29(1):131-135.
LOU Jun, SU Jun-hong, XU Jun-qi,et al. He-Ne laser light scattering detection optical damage threshold of thin film [J]. Journal of Applied Opties, 2008, 29(1):131-135. (in Chinese with an English abstract)
[7]SHIN-ICHI ZAITSU, SHINJI MOTOKOSHI, TAKAHISA JITSUNO, et al. large-area optical coatings with uniform thickness grown by surface chemical reactions for high power laser applications[J]. Jpn. J .Appl. Phys., 2002, 41: 160-165.
[8]SHINICHI ZAITSU, SHINJI MOTOKOSHI, TAKAHISA JITSUNO, et al. Laserinduced damage of optical coatings grown with surface chemical reaction[J]. SPIE, 1999, 3492: 204-211.
[9]SHIN-ICHI ZAITSU, TAKAHISA JITSUNO. Optical thin films consisting of nanoscale laminated layers [J]. Jpn. J .Appl. Phys., 2002, 41: 160-165.
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