频率扫描干涉中基于DFT的相位测量

王林春, 江月松, 郭泾平

王林春, 江月松, 郭泾平. 频率扫描干涉中基于DFT的相位测量[J]. 应用光学, 2010, 31(5): 757-761.
引用本文: 王林春, 江月松, 郭泾平. 频率扫描干涉中基于DFT的相位测量[J]. 应用光学, 2010, 31(5): 757-761.
shu
WANG Lin-chun, JIANG Yue-song, GUO Jing-ping. Phase measurement in frequency-sweeping interferometry based on DFT[J]. Journal of Applied Optics, 2010, 31(5): 757-761.
Citation: WANG Lin-chun, JIANG Yue-song, GUO Jing-ping. Phase measurement in frequency-sweeping interferometry based on DFT[J]. Journal of Applied Optics, 2010, 31(5): 757-761.
shu

频率扫描干涉中基于DFT的相位测量

  • 1.

    北京航空航天大学电子信息工程学院,北京100191;

  • 2.

    中国空间技术研究院,北京100094

详细信息
    通讯作者:

    王林春(1985-)，男，山西晋中人，北京航空航天大学在读硕士研究生，主要从事光电技术、空间激光信息技术方面的研究工作。

  • 中图分类号: TN247

Phase measurement in frequency-sweeping interferometry based on DFT

  • 1.

    School of Electronic Information Engineering,Beihang University,Beijing 100191,China;

  • 2.

    China Academy of Space Technology,Beijing 100094,China

摘要

    摘要
  • 摘要: 频率扫描干涉可以实现绝对距离测量，其中相位测量至关重要，其精度直接影响干涉测量的最终精度。从信号频域角度出发，提出了一种利用参考信号和测量信号离散傅里叶变换的相位测量方法。在对参考信号和测量信号采样前，分别对它们进行负向过零检测，当信号负向过零时才开始采样。对信号离散傅里叶变换后进行频谱分析，指出在信号采样前进行负向过零检测，可以消除信号频率值的相对偏差。根据理论分析，在LabVIEW中进行了建模仿真。结果表明：该方法具有精度高和抗噪声能力强等优点，在测量距离为10m时，相位测量平均值与理论值相差2，相对不确定度仅为0.105%。
    Abstract: Frequency-sweeping interferometry can be used to measure absolute distance and phase measurement plays an important part in it, because the precision of phase directly influences the precision of distance. The paper puts forward a new phase measurement method making use of Discrete Fourier Transform of reference signal and measurement signal. It does not start to sample until each signal crosses zero negatively. After the spectrum analysis, relative errors can be eliminated if zero-crossings can be tested before sampling signals. According to the theory, the paper has made simulations in LabVIEW, and the results show that the method has the advantages of high precision and good ability to overcome the noise. When the distance is 10m, the difference between the average of the measured phase and ideal value is 0.2, and relative uncertainty is 0.105%.
    • HTML全文
    • 参考文献(1)
  • ［1］江桂荣.双频相位测量轮廓术及其误差分析［J］.应用光学,2003,24(6):38-40.
    JIANG Gui-rong. Two-frequency method of ab-solute phase determination in profilometry and error analysis［J］. Journal of Applied Optics, 2003,24(6):38-40.(in Chinese with an English abstract)
    ［2］苏俊宏.用激光干涉法测量长度的智能化处理技术研究［J］.应用光学,2002,23(5):11-13.
    SU Jun-hong. Research on intell igentized te-chnology for measurement of length of by laser interferometry［J］. Journal of Applied Optics, 2002,23(5):11-13. (in Chinese with an English abstract)
    ［3］王建华，范开果，刘志锋，等.激光干涉法测量硅高温环境下的线膨胀系数的实验研究［J］. 应用光学,2007,28(5):645-648.
    WANG Jian-hua,FAN Kai-guo,LIU Zhi-feng,et al.Measurement of linear expansion coefficient of silicon in high temperature with laser in ter-ferometric dilatometer［J］. Journal of Applied Optics, 2007,28(5):645-648. (in Chinese with an English abstract)
    ［4］DAI XIAOLI, SETA KATUO. High-accuracy abso-lute distance measurement by means of wavelength scanning heterodyne interferometry［J］. Measure-ment Science and Technology, 1998,9:1031-1035.
    ［5］ALEXANDRE C, JOSE R. Absolute distance me-trology with frequency sweeping interferometry［J］. SPIE,2005,5879:1-10.
    ［6］SWINKELS B L,WENDRICH T J,BHATTACH-ARYA N,et al. Absolute distance metrology for space interferometers［J］. SPIE,2004,5495:314-318.
    ［7］BAS L SWINKELS,ABDELHALIM LATOUI,NA-NDINI BHATTACHARYA,et al. Absolute distance metrology for space interferometers［J］. SPIE,2005,5879:1-7.
    ［8］BAS LSWINKELS,NANDINI BHATTACHARYA,ARNO A.WIELDERS, et al. Absolute distance metrology for space interferometers［J］. SPIE, 2004,5856:312-317.
    ［9］齐国清.利用FFT相位差校正信号频率和初相估计的误差分析［J］.数据采集与处理,2003,18(1):7-11.
    QI Guo-qing. Error analysis of frequency and phase estimations based on phase difference of segmented FFTs［J］. Journal of Data Acquisition & Processing, 2003,18(1):7-11. (in Chinese with an English abstract)
    ［10］吴俊清.相位差的数字化测量研究［J］. 应用基础与工程科学学报, 2005,13(1):99-104.
    WU Jun-qing. Research of digitalmeasurement for phase difference［J］. Journal of Basic Science and Engineering,2005,13(1):99-104. (in Chinese with an English abstract)
    • 相关文章
    • 施引文献
    • 资源附件(0)
计量
  • 文章访问数:  2986
  • HTML全文浏览量:  162
  • PDF下载量:  986
  • 被引次数: 0
出版历程
  • 刊出日期:  2010-09-14

目录

摘要
HTML全文
    参考文献(1)
    相关文章
    施引文献
    资源附件(0)

    /

    返回文章
    返回

    相关数据库

    广告合作

    友情链接

    帮助中心

    扫描关注本刊微信平台

    您是第  2900785位访问者，欢迎！

    地址: 西安市电子三路西段9号 邮政编码: 710065 联系电话: 029-88288172

    版权所有 © 《应用光学》编辑部

    陕公网安备 61011302001501号       陕ICP备19002862号-1

    北京仁和汇智信息技术有限公司 开发  技术支持: info@rhhz.net   百度统计