基于线偏振光反射率测量介质折射率的研究

魏茂金, 杨崴崴, 刘德功

魏茂金, 杨崴崴, 刘德功. 基于线偏振光反射率测量介质折射率的研究[J]. 应用光学, 2010, 31(1): 100-104.
引用本文: 魏茂金, 杨崴崴, 刘德功. 基于线偏振光反射率测量介质折射率的研究[J]. 应用光学, 2010, 31(1): 100-104.
shu
WEI Mao-jin, YANG Wei-wei, LIU De-gong. The research measuring refractive indexof medium based on reflectivity of linear polarized light[J]. Journal of Applied Optics, 2010, 31(1): 100-104.
Citation: WEI Mao-jin, YANG Wei-wei, LIU De-gong. The research measuring refractive indexof medium based on reflectivity of linear polarized light[J]. Journal of Applied Optics, 2010, 31(1): 100-104.
shu

基于线偏振光反射率测量介质折射率的研究

  • 三明学院物理与机电工程系,福建三明365004

详细信息
    通讯作者:

    魏茂金(1964-)，男，福建沙县人，教授，主要从事光学技术与精密仪器研究工作。

  • 中图分类号: TN206

The research measuring refractive indexof medium based on reflectivity of linear polarized light

  • Department of Physics and Electromechanical Engineering,Sanming University,Sanming 365004,China

摘要

    摘要
  • 摘要: 研究线偏振光的振幅反射率与介质折射率的关系，提出一种测量介质材料折射率的方法。文中从菲涅耳公式出发，推导出各向同性介质的线偏振光反射率与折射率的关系式，给出基于线偏振光反射率测定介质折射率的原理。设计实验方案，在不同入射角情况，定出线偏振光p方向和s方向两种线偏振光在玻璃表面的反射率，得到线偏振光振幅反射率随入射角变化的实验曲线。依此实验数据得出材料的折射率。结果表明，测出的介质材料的折射率与理论值相符，所采取的测定方案可行。
    Abstract: The relationship between the amplitude reflectivity of linear polarized light and the refractive index of medium material was studied. A method was presented for measuring refractive index of medium materials. The relationship between the isotropic medium reflectivity of linear polarized light and the refractive index was derived from Fresnel formula. The principle on measuring refractive index of medium basedon reflectivity of linear polarized light was given. The configuration of the experimental installation was introduced. The variation curve was measured for the amplitude reflectivity of linear polarized light of P component and S component with changing angles of incidence. The refractive index of the materials was obtained according to the variation curve. The results show that a good agreement between experimental data of medium materials and the theory predictions is reached. The scheme is proved feasible.
    • HTML全文
    • 参考文献(1)
  • ［1］杨述武,王定兴.普通物理实验(光学部分)［M］.3版.北京:高等教育出版社,2000:57-63.
    YANG Shu-wu,WANG Ding-xing. General physics experiment(Optics)［M］. 3rd ed.Beijing: Higher Education Press, 2000:57-63.
    ［2］丰巨雷,吴俊林. 棱镜材料与其色散研究及应用［J］. 陕西师范大学学报：自然科学版,2007,35(11):61-62.
    FENG Ju-lei,WU Jun-lin. Prism material dispersion research andapplication［J］. Journal of Shanxi Normal University：Natural Science, 2007,35 (11):61-62.(in Chinese with an English abstract)
    ［3］邢进华.用布儒斯特角法同时测定单轴晶体的折射率和光轴方向［J］.大学物理,2004,23 (6):49-50.
    XING Jin-hua. Measurements of refractive indices and optical axis of uniaxial crystal using Brewster angle method［J］. College-Physics, 2004,23 (6):49-50.(in Chinese with an English abstract)
    ［4］郭秀芝,陈若辉.用布儒斯特角法测量各向同性固体的折射率［J］.吉林师范大学学报：自然科学版, 2006,28(3)：81-82.
    GUO Xiu-zhi,CHEN Ruo-hui. Measuring refractive indices of isotropic solid using brewster angle method［J］. Journal of Jilin Normal University：Natural Science Edition, 2006,28(3):81-82.(in Chinese with an English abstract)
    ［5］郭秀芝,张跃林.利用偏振光测定晶体折射率的实验设计［J］.北华大学学报：自然科学版,2007,7(6):495-497.
    GUO Xiu-zhi,ZHANG Yue-lin. Test design of measuring the crystal refractive indices by polarized light［J］. Journal of Beihua University：Natural Science, 2007,7(6):495-497.(in Chinese with an English abstract)
    ［6］夏辰安,宣昆,陆申龙，等.外推法测定半导体材料的折射率［J］. 物理实验, 2004,24(1):46-48.
    XIA Chen-an, XUAN Kun, LU Shen-long，et al. Determining refractive index of semiconductor material by extrapolation method［J］. Physics Experimentation, 2004,24(1):46-48.(in Chinese with an English abstract)
    ［7］郝殿中,吴福全,孔伟金.干涉法测量晶体的折射率［J］.激光技术,2003,27(5):407-408.
    HAO Dian-zhong, WU Fu-quan, KONG Wei-jin. Measurement of refractive index of crystals with interferometry［J］. Laser Technology ,2003,27(5):407-408.(in Chinese with an English abstract)
    ［8］马逊,刘祖明,陈庭金,等.椭圆偏振仪测量薄膜厚度和折射率［J］.云南师范大学学报,2005,25(4):24-27.
    MA Xun, LIU Zu-ming, CHEN Thing-jin,et al. Tin film material thickness and refractive index measurement by elliptical polarization instrument［J］. Journal of Yunnan Normal University, 2005,25(4):24-27.(in Chinese with an English abstract)
    ［9］杜学东，王红.薄膜测量的椭偏仪法［J］. 唐山师范学院学报,2002,24(5):67-68.
    DU Xue-dong, WANG Hong. Thin films measuring with ellipsometry［J］. Journal of Tangshan Teachers College, 22002,24(5):67-68.(in Chinese with an English abstract)
    ［10］姚启钧.光学教程［M］.3版.北京:高等教育出版社,2002.
    YAO Qi-jun. Optics course ［M］. 3rd ed.Beijing: Higher Education Press,2002.
    • 相关文章
    • 施引文献
    • 资源附件(0)
计量
  • 文章访问数:  3300
  • HTML全文浏览量:  120
  • PDF下载量:  1083
  • 被引次数: 0
出版历程
  • 刊出日期:  2010-01-14

目录

摘要
HTML全文
    参考文献(1)
    相关文章
    施引文献
    资源附件(0)

    /

    返回文章
    返回

    相关数据库

    广告合作

    友情链接

    帮助中心

    扫描关注本刊微信平台

    您是第  2899652位访问者，欢迎！

    地址: 西安市电子三路西段9号 邮政编码: 710065 联系电话: 029-88288172

    版权所有 © 《应用光学》编辑部

    陕公网安备 61011302001501号       陕ICP备19002862号-1

    北京仁和汇智信息技术有限公司 开发  技术支持: info@rhhz.net   百度统计