[1]MUNNERLYN C R,LATTA MILTON.Rough sur-face interferometry using a CO2 laser source[J]. Applied Optics, 1968,7:1858-1859.
[2]KWON O, WYANT J C, HAYSLETT C R.Rough surfaec interferometry at 10.6μm[J]. Applied Optics, 1980,19(11): 1863-1869.
[3]JAYDEEP K.SINHA,HAREESH TIPPUR V.In-frared interferometry for rough surface measurements:application to failure characterization and flaw detection[J]. Opt.Eng.,1997,36(8):2233-2239.
[4]KAUSHAL VERMA,BONGTAE HAN. Far-inf-rared Fizeau interferometry[J]. Applied Optics, 2001,40(28):4981-4987.
[5]KAUSHAL VERMA, BONGTAE HAN. Warpage measurement on dielectric rough surfaces of microelectronics devices by far infrared fizeau interferometry[J]. Journal of Electronic Packaging, 2000,122:227-232.
[6]陈进榜,陈磊,王青,等.大孔径移相式CO2激光干涉仪[J].中国激光,1998,25(1):31-36.
CHEN Jin-bang, CHEN Lei, WANG Qing, et al. A large aperture phase-shifting CO2 laser interferometer[J]. Chinese Journal of Lasers, 1998,25(1): 31-36.
[7]YONG HE,LEI CHEN, QING WANG, et al. Sur-eface roughness measurement using infrared phase-shifting digital interferometer[J]. SPIE, 2002,4927:170-176.
[8]何勇,陈磊,王青,等. 移相式泰曼-格林红外干涉仪及应用[J]. 红外与激光工程,2003,32(4):335-338.
HE Yong, CHEN Lei, WANG Qing, et al. Twyman-Green infrared phase-shifting inter-ferometer and application[J]. Infrared and Laser Engineering, 2003,32(4):335-338.
[9]贺俊,王青,陈磊. 移相式泰曼-格林红外干涉仪调试技术[J]. 红外与激光工程,2008,37(3):516-520.
HE Jun, WANG Qin, CHEN Lei. Alignment of Twyman-Green infrared phase-shifting inter-ferometer[J]. Infrared and Laser Engineering,2008,37(3):516-520.
|