大口径粗糙球面的检测

贺俊, 陈磊, 李新南

贺俊, 陈磊, 李新南. 大口径粗糙球面的检测[J]. 应用光学, 2009, 30(6): 969-973.
引用本文: 贺俊, 陈磊, 李新南. 大口径粗糙球面的检测[J]. 应用光学, 2009, 30(6): 969-973.
HE Jun, CHEN Lei, LI Xin-nan. Measurement of large aperture rough sphere[J]. Journal of Applied Optics, 2009, 30(6): 969-973.
Citation: HE Jun, CHEN Lei, LI Xin-nan. Measurement of large aperture rough sphere[J]. Journal of Applied Optics, 2009, 30(6): 969-973.

大口径粗糙球面的检测

详细信息
    作者简介:

    贺俊(1978-),男,江苏泰州人,博士生,主要研究方向为光学计量测试与光电智能化仪器。

  • 中图分类号: TN21

Measurement of large aperture rough sphere

  • 摘要: 为了解决大口径光学元件在精磨阶段的检测问题,基于电磁场散射理论,分析了在红外干涉仪测量粗糙表面过程中,所产生干涉条纹的对比度与粗糙表面粗糙度之间的关系,并通过测量不同粗糙表面对这一结果进行了实验验证。利用红外干涉仪测量了280#精磨粗糙球面(=1130mm,R=3600mm)的面形,讲述了测量大型粗糙球面时干涉仪的调整方法。从测量结果可以看出,此粗糙球面具有比较明显的球差,面形峰谷(PV)值为0.526(=10.6m),均方根(RMS)值为0.117(=10.6m)。
    Abstract: In order to measure optical components of large aperture in fine grinding process, the relationship of the contrast of interference fringes and the surface roughness was described by rigorous mathematical analysis based on the electromagnetic scattering theory. The mathematical derivation was verified with experimental data at different roughness. 280# rough sphere with aperture =1130mm, curvature radius R=3600mm, was measured by using the infrared interferometer. When a large aperture rough sphere was measured, the alignment method of infrared interferometer was introduced. The result shows that the rough sphere has obvious spherical aberration. The PV value of the rough sphere is 0.526 (=10.6m), and the RMS value is 0.117 (=10.6m).
  • [1]MUNNERLYN C R,LATTA MILTON.Rough sur-face interferometry using a CO2 laser source[J]. Applied Optics, 1968,7:1858-1859.
    [2]KWON O, WYANT J C, HAYSLETT C R.Rough surfaec interferometry at 10.6μm[J]. Applied Optics, 1980,19(11): 1863-1869.
    [3]JAYDEEP K.SINHA,HAREESH TIPPUR V.In-frared interferometry for rough surface measurements:application to failure characterization and flaw detection[J]. Opt.Eng.,1997,36(8):2233-2239.
    [4]KAUSHAL VERMA,BONGTAE HAN. Far-inf-rared Fizeau interferometry[J]. Applied Optics, 2001,40(28):4981-4987.
    [5]KAUSHAL VERMA, BONGTAE HAN. Warpage measurement on dielectric rough surfaces of microelectronics devices by far infrared fizeau interferometry[J]. Journal of Electronic Packaging, 2000,122:227-232.
    [6]陈进榜,陈磊,王青,等.大孔径移相式CO2激光干涉仪[J].中国激光,1998,25(1):31-36.
    CHEN Jin-bang, CHEN Lei, WANG Qing, et al. A large aperture phase-shifting CO2 laser interferometer[J]. Chinese Journal of Lasers, 1998,25(1): 31-36.
    [7]YONG HE,LEI CHEN, QING WANG, et al. Sur-eface roughness measurement using infrared phase-shifting digital interferometer[J]. SPIE, 2002,4927:170-176.
    [8]何勇,陈磊,王青,等. 移相式泰曼-格林红外干涉仪及应用[J]. 红外与激光工程,2003,32(4):335-338.
    HE Yong, CHEN Lei, WANG Qing, et al. Twyman-Green infrared phase-shifting inter-ferometer and application[J]. Infrared and Laser Engineering, 2003,32(4):335-338.
    [9]贺俊,王青,陈磊. 移相式泰曼-格林红外干涉仪调试技术[J]. 红外与激光工程,2008,37(3):516-520.
    HE Jun, WANG Qin, CHEN Lei. Alignment of Twyman-Green infrared phase-shifting inter-ferometer[J]. Infrared and Laser Engineering,2008,37(3):516-520.
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出版历程
  • 刊出日期:  2009-11-14

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