陈文建, 武风波. 基于光线追踪的三维轮廓测量技术研究[J]. 应用光学, 2008, 29(supp): 72-75.
引用本文: 陈文建, 武风波. 基于光线追踪的三维轮廓测量技术研究[J]. 应用光学, 2008, 29(supp): 72-75.
CHEN Wen-jian, WU Feng-bo. Measurement technology of three-dimensional outline based on ray tracing[J]. Journal of Applied Optics, 2008, 29(supp): 72-75.
Citation: CHEN Wen-jian, WU Feng-bo. Measurement technology of three-dimensional outline based on ray tracing[J]. Journal of Applied Optics, 2008, 29(supp): 72-75.

基于光线追踪的三维轮廓测量技术研究

Measurement technology of three-dimensional outline based on ray tracing

  • 摘要: 针对传统的三维轮廓测量中系统操作难和标定难的问题,提出一种基于条纹投影测量物体三维轮廓的新方法。文章给出系统的测量原理,详细讨论了CCD摄像机的标定方法和投影仪的标定过程,提出利用相位匹配方法求解空间坐标的概念。该测量方法去除了传统测量结构的平行度和垂直度的约束,系统标定和测量过程简单,工程上容易实现。理论分析和实验结果表明:该测量技术具有鲁棒性。

     

    Abstract: Aiming at the problems difficult to operate the measurement system and calibrate a system in conventional 3-D outline measurement, a new method to measure 3-D outline of an object based on projected fringe patterns is proposed. The measurement principle of the system is presented. The calibration method of CCD camera and calibration process of the projector are discussed. An idea to solve the spatial coordinates with phase matching is proposed. The restraint of parallelism and perpendicularity of conventional structures was eliminated. The system calibration and measurement process are simple, and easy to be realized in engineering. Theoretical analysis and measurement results show that the technology is robust and available.

     

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