散斑自相关分辨率测量和修正

罗诗淇; 刘京宙; 陈炫辉; 谢向生

散斑自相关分辨率测量和修正

汕头大学理学院物理系，广东汕头 515063

基金项目: 国家自然科学基金（12074444）；广东省基础与应用基础研究基金（2021A151501205）；

详细信息

作者简介:
罗诗淇（19—），女， E-mail：19sqluo@stu.edu.cn

通讯作者:
谢向生（1982—），男，博士，副教授，主要从事散射成像和矢量光场共聚焦成像技术研究。E-mail：xxs@stu.edu.cn

中图分类号: TN206
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- 文章访问数: 112
- HTML全文浏览量: 59
- PDF下载量: 37
- 被引次数: 0
出版历程
- 收稿日期: 2022-04-15
- 修回日期: 2022-06-28
- 网络出版日期: 2022-07-05

Speckle Autocorrelation resolution measurement and correction

Department of Physics, College of Science, Shantou University, Shantou, Guangdong 515063, China

摘要

摘要: 散斑相关是许多基于散斑的光学测量和成像技术的基础，决定了光学系统的分辨率。当前散斑尺寸（颗粒度或分辨率）的理论描述不够精确，也缺乏实验验证。该文探究了散斑图样自相关尺寸的影响因素，与相同数值孔径物镜聚焦进行比对，揭示薄散射介质的“散射透镜”性质。通过散斑自相关和透镜聚焦尺寸的多组测量，结果表明，截趾函数会影响其分辨率，需要根据具体光路对阿贝判据做修正。对基于散斑的测量和成像技术具有一定的参考价值。
- 散斑相关 /
- 阿贝判据 /
- 散射透镜 /
- 点扩散函数
Abstract: Speckle correlation is the basis of speckle-based optical measurements and imaging recovery technologies, which determines the resolution of the opitcal system. At present, the theoretical description of speckle size (grain or resolution) is not accurate enough, and lacks of experimental verification. This paper explores the influencing factors of speckle pattern autocorrelation size, and compares it with the same numerical aperture objective focusing to reveal the 'scattering lens' properties of thin scattering medium. Through multiple sets of measurements of speckle autocorrelation and lens focusing size, the results show that the apodization function will affect their resolution, and the Abbe criterion needs to be corrected according to the specific optical path. This paper has a certain reference value for speckle-based measurement and imaging technology.
- speckle correlation /
- Abbe Criterion /
- scattering lens /
- point spread function

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图 1 波前调制实现薄散射介质后的聚焦

Fig. 1 Wavefront modulation for focusing thin scattering medium

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图 2 散射片下散斑自相关曲线

Fig. 2 Speckle autocorrelation curves through

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图 3 透镜焦斑和散射体散斑测量光路

Fig. 3 Lens focal spot and scatterer speckle measurement optical path

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图 4 刀口仪捕获焦斑图像

Fig. 4 Focal spot image captured by knife edge tester

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图 5 散斑自相关与透镜聚焦分辨率比对

Fig. 5 Comparison of speckle autocorrelation and lens focusing .

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图 6 模型建立原理

Fig. 6 Principle of Model Establishment

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图 7 CMOS不同位置散斑对应的等效数值孔径

Fig. 7 Equivalent numerical aperture for speckles at different locations at the CMOS plane.

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表 1 通过透镜后的焦斑测量

Table 1 Focal spot measurement after lens

光阑直径 d/mm	实际焦斑直径$ y/\mu {\text{m}} $	阿贝判据理论值/$ \mu {\text{m}} $	误差/%
17	44.008	41.657	5.644
15	49.587	47.212	5.030
12	61.364	58.991	4.021
10	71.901	70.672	1.739
8	89.256	88.340	1.037

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表 2 通过散射介质后的散斑测量

Table 2 Speckle measurement after scattering medium

光阑直径 d/mm	散斑自相关测量值y/μm	阿贝判据理论值/ μm	误差/ %
17	45.079	41.657	8.214
15	50.400	47.212	6.753
12	61.314	58.991	3.938
10	72.688	70.672	2.853
8	90.158	88.340	2.058

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表 3 通过透镜后的焦斑测量（修正后）

Table 3 Focal spot measurement after lens（Theoretical correction）

光阑直径 d/mm	实际焦斑直径y/μm	修正系数	修正理论值/μm	误差/%
17	44.008	1.057	44.363	0.752
15	49.587	1.045	49.642	1.138
12	61.364	1.031	61.112	0.919
10	71.901	1.025	72.626	0.999
8	89.256	1.020	90.308	0.650

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表 4 通过散射介质后的散斑测量（修正后）

Table 4 Speckle measurement after scattering medium（Theoretical correction）

光阑直径 d/mm	散斑自相关测量值y/μm	修正系数	修正理论值/μm	误差/%
17	45.079	1.044	44.363	1.616
15	50.400	1.051	49.642	1.527
12	61.314	1.035	61.112	0.325
10	72.688	1.027	72.626	0.088
8	90.158	1.022	90.308	0.164

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