双目显微系统光路偏转与平行性检测

Measurement of optical path deflection and parallelism in binocular microscope system

摘要: 针对双目系统中各自光路的偏转和2条光路之间的不平行会增加轴外像差，降低成像质量，并造成双目视觉的不同一性，引起使用者的不适，提出一套激光检测和评价双目系统光路偏转和平行性的方法。将待测系统拆分成元件，先检测元件的光路偏转和平行性，然后逐步组合元件，实验测得待测双目系统光路存在0.5 mm以上的光路偏转距离，入射平行光出射系统后夹角达0.8左右。结果表明，该方法可以应用于显微镜工业生产和检测之中。

Abstract: Deflection in each optical path of binocular microscope system and unparallelism between them can increase the off-axis aberration, reduce the imaging quality, cause the nonidentity of binocular vision and lead to discomfort when used. A set of new method using laser is introduced to detect light path deflection and unparallelism. First of all, the system under test is divided into components and detected in each element, and then the parts are put together. A light path deflection distance more over than 0.5mm was detected in the experiment and a angle of about 0.8 was formed between the two outgoing beams after parallel light passing through the system. It is concluded that this method can be applied to industrial production and detection of microscope.