双目显微系统光路偏转与平行性检测

徐鹍, 韩森, 张齐元, 谢翔, 张中华, 刘文滨, 聂英华, 吴泉英

徐鹍, 韩森, 张齐元, 谢翔, 张中华, 刘文滨, 聂英华, 吴泉英. 双目显微系统光路偏转与平行性检测[J]. 应用光学, 2014, 35(3): 452-458.
引用本文: 徐鹍, 韩森, 张齐元, 谢翔, 张中华, 刘文滨, 聂英华, 吴泉英. 双目显微系统光路偏转与平行性检测[J]. 应用光学, 2014, 35(3): 452-458.
shu
XU Ku, HAN Sen, ZHANG Qi-yuan, XIE Xiang, ZHANG Zhong-hua, LIU Wen-bin, NIE Ying-hua, WU Quan-ying. Measurement of optical path deflection and parallelism in binocular microscope system[J]. Journal of Applied Optics, 2014, 35(3): 452-458.
Citation: XU Ku, HAN Sen, ZHANG Qi-yuan, XIE Xiang, ZHANG Zhong-hua, LIU Wen-bin, NIE Ying-hua, WU Quan-ying. Measurement of optical path deflection and parallelism in binocular microscope system[J]. Journal of Applied Optics, 2014, 35(3): 452-458.
shu

双目显微系统光路偏转与平行性检测

  • 1.

    苏州慧利仪器有限责任公司,江苏 苏州 215123;

  • 2.

    苏州科技学院,江苏 苏州 215000;

  • 3.

    上海理工大学,上海 200093;

  • 4.

    六六视觉科技股份有限公司,江苏 苏州 215000;

  • 5.

    黑龙江省计量检定测试院,黑龙江 哈尔滨 150036

详细信息
    通讯作者:

    徐鹍（1983-）, 男，山西岢岚人，硕士研究生，主要从事光学检测、机器视觉和模式识别工作。 Email:yikunemail@163.com

  • 中图分类号: TN206；O439

Measurement of optical path deflection and parallelism in binocular microscope system

  • 1.

    Suzhou H&L Instruments LLC,Suzhou 215123,China;

  • 2.

    Suzhou University of Science and Technology,Suzhou 215000,China;

  • 3.

    University of Shanghai for Science and Technology,Shanghai 200093,China;

  • 4.

    66 Vision Technology Co.,Ltd, Suzhou 215000,China;

  • 5.

    Heilongjiang Provincial Institute of Measurement &Verification,Harbin 150036,China

摘要

    摘要
  • 摘要: 针对双目系统中各自光路的偏转和2条光路之间的不平行会增加轴外像差，降低成像质量，并造成双目视觉的不同一性，引起使用者的不适，提出一套激光检测和评价双目系统光路偏转和平行性的方法。将待测系统拆分成元件，先检测元件的光路偏转和平行性，然后逐步组合元件，实验测得待测双目系统光路存在0.5 mm以上的光路偏转距离，入射平行光出射系统后夹角达0.8左右。结果表明，该方法可以应用于显微镜工业生产和检测之中。
    Abstract: Deflection in each optical path of binocular microscope system and unparallelism between them can increase the off-axis aberration, reduce the imaging quality, cause the nonidentity of binocular vision and lead to discomfort when used. A set of new method using laser is introduced to detect light path deflection and unparallelism. First of all, the system under test is divided into components and detected in each element, and then the parts are put together. A light path deflection distance more over than 0.5mm was detected in the experiment and a angle of about 0.8 was formed between the two outgoing beams after parallel light passing through the system. It is concluded that this method can be applied to industrial production and detection of microscope.
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  • 刊出日期:  2014-05-14

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