红外光学材料透过率温度特性测量方法

许荣国; 王雷; 阴万宏; 杨照金

红外光学材料透过率温度特性测量方法

1.
西安应用光学研究所,陕西西安 710065

详细信息

通讯作者:
许荣国（1980-），男，陕西武功人，硕士，工程师，主要从事软件工程与光学计量工作。 Email:xrg1980@sina.com

中图分类号: TN219
计量
- 文章访问数: 2276
- HTML全文浏览量: 152
- PDF下载量: 420
- 被引次数: 0
出版历程
- 刊出日期: 2013-11-15

Measuring method of temperature coefficient of infrared optical material transmittance

1.
Xi-an Institute of Applied Optics,Xi-an 710065,China

摘要

摘要: 提出了一种变温条件下红外光学材料透过率测量评价方法。研究内容包括使用准直反射镜将红外光源变为平行光，通过斩波器变为脉冲光，再经滤光片选择波长；使用平面反射镜组与精密温控炉来获得变温条件下的双光路：测试光路与参考光路。使用前置放大电路和锁相放大器对红外微弱信号进行检测，根据两个光路的测量电压计算样品的透过率及透过率温度系数。计算机实现自动控制、采集与相关运算。该方法解决了变温条件下红外光学材料透过率测量中的实际应用问题，使光学材料参数检测从常规检测扩展到高温等极端条件，更接近于材料的实际使用条件，蓝宝石材料在波长5195 nm处，透过率高于10%，温度从室温到700℃的范围内，重复性优于0.2%。
- 斩波法 /
- 双光路 /
- 透过率 /
- 温度系数
Abstract: A new transmittance measurement and assessment method of the infrared optical material at diffident temperatures was proposed. A collimation reflect mirror was used to make the infrared light source into the parallel light, and then a chopper was used to make the continuous light into the pulse light, besides, a special wavelength was obtained by filter. A special data acquisition system that including a preamplifier circuit, a lock-in amplifier, a computer and a control software could calculate the value of infrared transmittance and give the temperature coefficient of the optical material by means of double light beam contrast measurement. The method resolved problems of infrared transmittance measurement of optical material in actual operational environment, like high temperature. Test result shows the transmittance of sapphire material is higher than 10% at the wavelength of 519 5 nm, and the repeatability is better that 0.2% from room temperature up to 700℃. The method has great economic and social utility.
- chopper method /
- double light beam /
- transmittance /
- temperature coefficient

HTML全文

参考文献(1)

［1］熊长新,杨林峰高透过率红外窗口保护薄膜的研制[J]光学与光电技术,2009,7(6):45-47
XIONG Chang-xin, YANG Lin-feng-Deposition of high transmittance protective coatings on IR windows[J].Optics and Optoelectronic Technology, 2009,7(6):45-47.(in Chinese with an English abstract)
[2]王雷,王生云,侯西琪，等.红外光学材料参数测试[J].应用光学,2001,22(6):40-43.
WANG Li,WANG Sheng-yun,HOU Xi-qi,et al.Parameter testing of infrared optical material[J].Journal of Applied Optics,2001,22(6):40-43.(in Chinese with an English abstract)
[3]RAINE K W,PENFOLD A B.An instrument for measuring the thermal coefficient of refraction index in the infrared[J].Phys. E Sci. Instrum,1985,18:593-595.
[4]RAINE K W,KIBBLE A E L.Measurement of the thermal coefficient of refraction index of solid materials in the wavelength range 3 μm to 5 μm[R]. UK:NPL, 1992.
[5]KUTSAY O M,GORSGTEIN B A. Diamond-like carbon films in multilayered influence coatings for IR optical elements[J].Diamond and Related Materials,2001(10):1846-1848.
[6]NOVIKOY N V,GONTAR A G.Protective diamond-like carbon coatings for optical materials and electronic devices[J].Diamond and Related Materials,2000(9):792-795.
[7]李国强,介万奇,华惠.根据红外透过率推断CdZnTe晶片的性能[J].红外与毫米波学报,2003,22(6):469-472.
   LI Guo-qiang,QIAO Wan-qi,HUA Hui.Deducing the properties of CdZnTe wafers by IR transmission[J].Journal of Infrared and Millimeter Waves,2003,22(6):469-472.(in Chinese with an English abstract)
[8]张洋,张记龙,杜宣燕.基于HgCdTe红外探测器的微弱信号检测电路设计[J].应用光学,2011,32(4):779-783.
   ZHANG Yang,ZHANG Ji-long,DU Xuan-yan.Weak signal detection circuit based on HgCdTe IR detector[J].Journal of Applied Optics,2011,32(4):779-783.(in Chinese with an English abstract)
[9]卫翠玉,胡炳樑,邵秀娟，等.ORCAD在HgCdTe红外探测器放大电路低噪声设计中的应用[J].电子器件,2009,32(2):324-328.
   WEI Cui-yu,HU Bing-liang,SHAO Xiu-jian,et al.Reseach on low noise design of HgCdTe infrared detector amplifying circuit based on ORCAD[J].Chinese Journal Of Electron Devices,2009,32(2):324-328.(in Chinese with an English abstract)
[10]肖寅东,赵辉,王厚军.基于锁相放大的微弱信号检测电路前置滤波器设计[J].测控技术,2007,26(3):86-88.
XIAO Yin-dong,ZHAO Hui,WANG Hou-jin.Perfilter design method for weak signal detection with LIA[J].Control Technology,2007,26(3):86-88.(in Chinese with an English abstract)

施引文献

资源附件(0)

访问统计