光学中心偏测量仪中心偏测量误差校准方法

    Calibration method of center deviation measurement errors of optical center deviation measuring instrument

    • 摘要: 光学中心偏测量仪是一种高精度光学测试设备,主要用于光学系统的胶合、装调和自动检测过程,其测量精度主要由中心偏的测量误差决定。介绍了一种光学中心偏测量仪中心偏测量误差的校准方法,通过分析光学中心偏测量仪的透射式和反射式测量原理,设计使用标准半球与电感测微仪作为量传设备,实现光学中心偏测量仪中心偏测量误差的校准与溯源。最后,根据所设计的方法,在一台OptiCentric中心偏测量仪上进行校准。校准结果显示,中心偏测量重复性优于0.03 μm,扩展不确定度U=0.12 μm(k=2)。研究结果表明,使用该方法可以实现对光学中心偏测量仪的中心偏测量误差的校准,并且该校准方法中使用的设备较为成熟,操作简单,能够形成完整的溯源关系,拥有良好的应用前景。

       

      Abstract: The optical center deviation measuring instrument is a high-precision optical testing device mainly used in the bonding, assembly and automatic detection processes of optical systems, and its measurement accuracy is mainly determined by the errors of its center deviation measurement. A calibration method for the center deviation measurement errors of an optical center deviation measuring instrument was introduced. By analyzing the transmission and reflection measurement principles of the optical center deviation measuring instrument, a standard hemisphere and an inductive micrometer were designed as the transmission equipment to achieve calibration and traceability of the center deviation measurement errors of the optical center deviation measuring instrument. Finally, calibration was performed on an OptiCentric center deviation measuring instrument. The calibration results show that the repeatability of center deviation measurement is better than 0.03 μm, and the expanded uncertainty U is 0.12 μm (k=2). The research results show that using this calibration method can effectively transfer the measurement errors of optical center deviation measuring instrument, and the equipment used in this calibration method is relatively mature, easy to operate, able to form a complete traceability relationship, which has good application prospects.

       

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